The Group has a suite of laboratories containing state-of-the-art processing and test equipment. The Telecommunications Systems Laboratories house amplified in-line and recirculating loop testbeds operating at very high data rates (>80 Gb/s) with Bit Error Rate test capability and WDM. The Group operates 4 CW/pulsed UV laser grating inscription systems for fibre and planar device fabrication, as well as an amplified femtosecond pulse (3 mJ) Ti:sapphire system for advanced fabrication studies. A Class 1000 facility clean room has recently been constructed and equipped for planar device fabrication

1. Data analysis

Major  equipment  includes:  

  • LeCroy  SDA  100G  Serial Data  Analyzer  
  • Anritsu  MP1764A  12.5GHz  Error Detector 
  • Agilent 86100A Wide-Bandwidth Oscilloscope
  • HP  83480A  Digital  Communications Analyzer 
  • Agilent 71400C Lightwave Signal Analyzer
  • Bit error rate testing 
  • Eye diagram measurements
  • Complete jitter analysis
  • Waveform measurements


AIPT measurement 1

2. Pulse characterization

Major equipment includes:
  • Inrad Autocorrelator Model 5-14-LD
  • APE PulseCheck Autocorrelator 
  • Avesta  AA-10DD Scanning Autocorrelator 10-30000 fs pulse duration range, scanning rate: 0.1-20 Hz
  • FROG measurement 

AIPT measurement 3

3. Spectrum analysis

AIPT measurement 5
Major equipment includes:

  • Yokogawa AQ6375 Optical Spectrum Analyser
  • Agilent 86142B High Performance Optical Spectrum Analyzer
  • Ando AQ6317B
  • Optical Spectrum Analyzer and several others
  • 600-2400 nm wavelength range 
  • Accuracy: ±0.01nm 
  • Level range: +20 to -90dBm 

4. Dispersion measurement

AIPT measurement 7
Major equipment includes: 
  • Agilent 86037C Chromatic Dispersion Measurement Kit 
  • Luna OVA (Optical Vector Analyzer)

For both optical fibre and components
1510-1640 nm wavelength range
Accuracy: ±5ps/nm
Resolution: ~1pm

5. Polarization dependent  analysis

AIPT measurement 8
Major equipment includes: 
  • Luna OVA (Optical Vector Analyzer) 
  • Thorlabs In-Line Fiber Polarimeter- IPM5300 
  • Polarization Dependent Loss (PDL) 
  • Polarization Mode Dispersion (PMD)/ Second Order

PDL Accuracy: ±0.03dB
PMD Accuracy: ±0.08ps (1st order), ± 2ps2 (2nd order)

6. Advanced Optical Spectroscopy

AIPT measurement 10

Major equipment includes: 
  • Horiba Nanolog Photoluminescence Excitation-Emission Spectrometer (300-1700 nm) 
  • Perkin Elmer Lambda 1050 UV-VIS-Near IR spectrometer (170 -3300 nm) 
  • Microscopic Raman Spectrometer  (excitation 514 nm)

Covering 170nm-3300nm wavelength range
UV/Vis Resolution: 0.05 nm
NIR Resolution: 0.20 nm

7. Light sources for measurement

AIPT measurement 11
Major equipment includes: 
  • Fianium femtopower 1060 surpercontinuum source
  • Koheras SuperK Compact surpercontinuum source
  • Agilent tunable laser 81640A, 
  • New Focus 6428 Vidia Swept Tunable Laser and many other tunable or wideband light sources. 

Covering 450nm-2400nm wavelength range
Power: 4.5W (Fiamium), 100mW (SuperK)

8. Temperature and humidity testing

AIPT measurement 12

Major equipment includes: 
  • Sanyo environmental chamber Gallenkamp 
  • Carbolite CWF1100 Laboratory chamber furnaces Carbolite 250°C convection laboratory ovens (PF) Genlab Laboratory oven

Temperature and humidity cycle test capability
Temperature up to 1100°C (CWF1100)

9. Surface analysis (within Surface Science Group)

AIPT measurement 13
Major equipment includes: 
  • X-Ray Photoelectron Spectrometer (XPS)
  • Auger Electron Spectrometer (AES)
  • Time of Flight Secondary Ion Mass Spectrometry (ToFSIMS)
  • Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM)
  • Nano Test Platform

Spatial resolution: 7 nm (AES), 10nm (XPS)