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Measurement Equipment 

The Group has a suite of laboratories containing state-of-the-art processing and test equipment. The Telecommunications Systems Laboratories house amplified in-line and recirculating loop testbeds operating at very high data rates (>80 Gb/s) with Bit Error Rate test capability and WDM. The Group operates 4 CW/pulsed UV laser grating inscription systems for fibre and planar device fabrication, as well as an amplified femtosecond pulse (3 mJ) Ti:sapphire system for advanced fabrication studies. A Class 1000 facility clean room has recently been constructed and equipped for planar device fabrication

This equipment available for SME and industrial collaboration, please contact Dr Kaiming Zhou


1. Data analysis

Major  equipment  includes:  

  • LeCroy  SDA  100G  Serial Data  Analyzer  
  • Anritsu  MP1764A  12.5GHz  Error Detector 
  • Agilent 86100A Wide-Bandwidth Oscilloscope
  • HP  83480A  Digital  Communications Analyzer 
  • Agilent 71400C Lightwave Signal Analyzer
  • Bit error rate testing 
  • Eye diagram measurements
  • Complete jitter analysis
  • Waveform measurements

 

AIPT measurement 1

2. Pulse characterization

Major equipment includes:
  • Inrad Autocorrelator Model 5-14-LD
  • APE PulseCheck Autocorrelator 
  • Avesta  AA-10DD Scanning Autocorrelator 10-30000 fs pulse duration range, scanning rate: 0.1-20 Hz
  • FROG measurement 


AIPT measurement 3

3. Spectrum analysis


AIPT measurement 5
Major equipment includes:

  • Yokogawa AQ6375 Optical Spectrum Analyser
  • Agilent 86142B High Performance Optical Spectrum Analyzer
  • Ando AQ6317B
  • Optical Spectrum Analyzer and several others
  • 600-2400 nm wavelength range 
  • Accuracy: ±0.01nm 
  • Level range: +20 to -90dBm 


4. Dispersion measurement

AIPT measurement 7
Major equipment includes: 
  • Agilent 86037C Chromatic Dispersion Measurement Kit 
  • Luna OVA (Optical Vector Analyzer)

For both optical fibre and components
1510-1640 nm wavelength range
Accuracy: ±5ps/nm
Resolution: ~1pm

5. Polarization dependent  analysis

AIPT measurement 8
Major equipment includes: 
  • Luna OVA (Optical Vector Analyzer) 
  • Thorlabs In-Line Fiber Polarimeter- IPM5300 
  • Polarization Dependent Loss (PDL) 
  • Polarization Mode Dispersion (PMD)/ Second Order

PDL Accuracy: ±0.03dB
PMD Accuracy: ±0.08ps (1st order), ± 2ps2 (2nd order)

6. Advanced Optical Spectroscopy

AIPT measurement 10

Major equipment includes: 
  • Horiba Nanolog Photoluminescence Excitation-Emission Spectrometer (300-1700 nm) 
  • Perkin Elmer Lambda 1050 UV-VIS-Near IR spectrometer (170 -3300 nm) 
  • Microscopic Raman Spectrometer  (excitation 514 nm)

Covering 170nm-3300nm wavelength range
UV/Vis Resolution: 0.05 nm
NIR Resolution: 0.20 nm

7. Light sources for measurement

AIPT measurement 11
Major equipment includes: 
  • Fianium femtopower 1060 surpercontinuum source
  • Koheras SuperK Compact surpercontinuum source
  • Agilent tunable laser 81640A, 
  • New Focus 6428 Vidia Swept Tunable Laser and many other tunable or wideband light sources. 

Covering 450nm-2400nm wavelength range
Power: 4.5W (Fiamium), 100mW (SuperK)

8. Temperature and humidity testing

AIPT measurement 12

Major equipment includes: 
  • Sanyo environmental chamber Gallenkamp 
  • Carbolite CWF1100 Laboratory chamber furnaces Carbolite 250°C convection laboratory ovens (PF) Genlab Laboratory oven

Temperature and humidity cycle test capability
Temperature up to 1100°C (CWF1100)


9. Surface analysis (within Surface Science Group)

AIPT measurement 13
Major equipment includes: 
  • X-Ray Photoelectron Spectrometer (XPS)
  • Auger Electron Spectrometer (AES)
  • Time of Flight Secondary Ion Mass Spectrometry (ToFSIMS)
  • Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM)
  • Nano Test Platform

Spatial resolution: 7 nm (AES), 10nm (XPS)